icroelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.Additional regular features will include:? Special issues devoted to significant international conferences, or to important developing topics? Letters to the Editors? Industrial news and updates? Calendar of forthcoming events? Book reviewsMicroelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.

《微電子可靠性》致力于傳播有關微電子器件、電路和系統可靠性的最新研究成果和相關信息，從材料、工藝和制造，到設計、測試和操作。雜志的內容包括:測量、理解和分析;評估和預測;建模與仿真;方法和緩解。將可靠性與微電子工程的其他重要領域，如設計、制造、集成、測試和現場操作相結合的論文也將受到歡迎，并特別鼓勵在該領域和具體應用領域報告實際案例研究的論文。大多數被接受的論文將作為研究論文發表，描述重大進展和完成的工作。審查一般感興趣的重要發展主題的論文可以作為審查論文發表。可以考慮將性質較初步的緊急來文和關于目前感興趣的已完成實際工作的簡短報告作為研究說明出版。所有的貢獻都要經過該領域主要專家的同行審查。其他常規功能包括:?專門討論重大國際會議或重要發展主題的專題?給編輯的信?行業新聞和更新?即將舉行活動的日歷?書評微電子可靠性是一個不可或缺的論壇，在學術和工業環境的微電子可靠性專業人士之間，以及所有那些以任何方式與一個穩步增長的微電子工業及其許多應用領域相關的人之間，交流知識和經驗。